The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Nov. 07, 2017
Santec Corporation, Komaki, Aichi, JP;
Changho Chong, Los Altos, CA (US);
SANTEC CORPORATION, Komaki, JP;
Abstract
An optical system includes a light source, an interferometer, and a detector. The interferometer includes a scanner and a lens system disposed downstream of the scanner. The scanner is configured to direct a portion of the optical beam along one of a plurality of different directions within a scanning range. The lens system is configured to project the portion of optical beam to an imaging area defined by a field of view of the optical system, the lens system comprising a first lens, wherein an aspect of the first lens is adjustable so as to render the field of view adjustable without adjusting the scanning range of the scanner. The detector is configured to receive a reflected portion of the optical beam that reflects from an object placed within the imaging area.