The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Jun. 14, 2017
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Carl Zeiss Meditec Ag, Jena, DE;
Yuan Liu, Dublin, CA (US);
Nathan Shemonski, San Mateo, CA (US);
Matthew J. Everett, Livermore, CA (US);
CARL ZEISS MEDITEC, INC., Dublin, CA (US);
Abstract
An efficient OCT data collection and processing method for obtaining a high-axial-resolution image with explicit ranging over an extended depth is described. The method includes collecting a first dataset at a transverse location of the sample. The first dataset comprises spectra of a bandwidth (Δk) sampled at a spectral sampling interval (dk). A second dataset comprising spectra of a bandwidth (Δk) sampled at a spectral sampling interval (dk) is collected. The bandwidth Δkis less than Δkand spectral sampling interval dkis less than dk. The first and the second datasets are processed to generate at least one A-scan with an axial resolution higher than the axial resolution corresponding to the bandwidth Δkand a depth range larger than the depth range provided by sampling interval dk.