The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

May. 22, 2017
Applicant:

New Jersey Institute of Technology, Newark, NJ (US);

Inventors:

Reginald C. Farrow, Somerset, NJ (US);

Alokik Kanwal, Princeton, NJ (US);

Arooj A. Aslam, Paterson, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B82B 1/00 (2006.01); B82B 3/00 (2006.01); G01N 27/12 (2006.01); G01N 27/27 (2006.01); G01N 27/414 (2006.01); H01L 51/00 (2006.01); B82Y 10/00 (2011.01); B82Y 15/00 (2011.01); G01N 27/22 (2006.01); G01N 27/327 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
B82B 1/001 (2013.01); B82B 3/0014 (2013.01); G01N 27/127 (2013.01); G01N 27/27 (2013.01); G01N 27/4146 (2013.01); B82Y 10/00 (2013.01); B82Y 15/00 (2013.01); G01N 27/227 (2013.01); G01N 27/3278 (2013.01); G01N 33/48728 (2013.01); H01L 51/0048 (2013.01);
Abstract

An imaging device and method of using is provided that requires no traditional optics but uses an addressable array of vertically oriented carbon nanotubes. The technique relies on the ability to reduce the nearest neighbor spacing between the carbon nanotubes to less than the wavelength of light used in traditional optical microscopes. The nanoscope can have a resolution of less than 100 nm. Electrophoresis deposition can be used to direct the assembly of the carbon nanotubes onto interconnects in an integrated circuit, which could be used to address the array. The device is portable, compact, and does not utilize complicated components. It also derives spatially resolved dielectric and chemical properties of a sample to be imaged.


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