The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Jul. 06, 2017
Applicant:

Honeywell Limited, Mississauga, CA;

Inventors:

Balamurugan Ramakrishnan, Dindigul, IN;

Gajanan Rothe, Bangalore, IN;

Niranjan Rao, Bangalore, IN;

Lingathurai Palanisamy, Bangalore, IN;

Ajaykumar R Bangur, Bangalore, IN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 26/02 (2006.01); B65H 20/02 (2006.01); D21G 9/00 (2006.01);
U.S. Cl.
CPC ...
B65H 26/02 (2013.01); B65H 20/02 (2013.01); D21G 9/0009 (2013.01);
Abstract

Monitoring continuous repetitive web sheet defects to determine the causes of such defects by creating unique diagnostic patterns associated with selected components of a web-making machine and employing pattern recognition techniques to analyze and classify web-sheet dynamic and deterministic defect patterns, and identify their root causes. Corrective actions can be effected thereby enhancing machine run-time to minimize late deliveries and improves overall product quality. The technique which is integrated with quality control system can be applied to the manufacturer of paper, packaging, rubber sheets, plastic film, metal foil, and the like.


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