The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Nov. 07, 2016
U.s.a. As Represented BY the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);
Godfrey Sauti, Hampton, VA (US);
Jae-Woo Kim, Newport News, VA (US);
Emilie J. Siochi, Newport News, VA (US);
John M. Gardner, Newport News, VA (US);
Christopher J. Stelter, Newport News, VA (US);
United States of America as represented by the Administrator of NASA, Washington, DC (US);
Abstract
A method of controlling an additive fabrication process includes providing a primary substrate and a test substrate. Polymer test material is extruded onto the test substrate utilizing an extrusion head. The extrusion head is moved relative to the test substrate, and a force required to move the extrusion head relative to the test substrate is measured to thereby generate test data. A part is fabricated by extruding polymer material onto the primary substrate utilizing the extrusion head. The test data is utilized to control at least one process parameter associated with extruding polymer material onto the primary substrate.