The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Dec. 19, 2016
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Venkateshwar R Aitharaju, Troy, MI (US);

Nicholas W Pinto, IV, Shelby Township, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 70/54 (2006.01); B29C 70/48 (2006.01); B29C 33/22 (2006.01);
U.S. Cl.
CPC ...
B29C 33/22 (2013.01); B29C 70/48 (2013.01);
Abstract

A die face monitoring system may include an upper die having an upper die face and an upper die opening extending towards the upper die face. Similarly, a lower die may include a lower die face and a lower die opening extending towards the lower die face. The lower die face is arranged to confront the upper die face and form a concavity therebetween. Furthermore, a plurality of sensors are mounted on a press, with each sensor corresponding to each one of the upper and lower die openings. Each sensor emits a beam of light towards and receives a reflection from a target surface within the upper and lower die openings in order to calculate a distance thereto.


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