The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Jul. 17, 2017
Applicant:

Depuy Ireland Unlimited Company, Cork, IE;

Inventor:

Michael Reeve, Leeds, GB;

Assignee:

DEPUY IRELAND LIMITED COMPANY, Loughbeg Industrial Estate, Cork, IE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 2/46 (2006.01); A61B 17/02 (2006.01);
U.S. Cl.
CPC ...
A61F 2/4657 (2013.01); A61F 2/4684 (2013.01); A61B 2017/0268 (2013.01); A61F 2002/4658 (2013.01);
Abstract

A measuring instrument () for use during an orthopaedic surgical procedure to measure first and second distances from a reference point on a bone to first and second measurement points respectively. The measuring instrument has a first scale () for displaying the first distance and a second scale () for displaying the second distance. It includes a mask () which can be positioned against the second scale after the first distance has been measured in a position that is selected relative to the second scale dependent on the measured first distance, to restrict the length of the second scale that is visible to the user.


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