The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Feb. 05, 2016
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Toshiba Medical Systems Corporation, Otawara, JP;
Adam Petschke, Vernon Hills, IL (US);
Gin-Chung Wang, Lincolnshire, IL (US);
Yu Zou, Naperville, IL (US);
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
A method and apparatus is provided to decompose spectral computed tomography (CT) projection data into material components using singles-counts and total-counts projection data. The singles-counts projection data more accurately solves the material decomposition problem, but can produce multiple results only one of which is correct. The total-counts projection data generates a unique result, but is less precise. The total-counts projection data is used to disambiguate the multiple results of the singles-counts projection data providing a unique results that is also precise. The unique and precise material decomposition can be achieved by limiting a search region for the singles-counts result to a neighborhood surrounding the total-counts result, choosing a singles-counts result that is closest to the total-counts result, choosing a singles-counts result that minimizes a total-counts cost function, or using a combined cost function that includes a singles-counts projection data and energy-integrated projection data.