The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Jul. 26, 2017
Applicant:
Spot You More, Inc., Raleigh, NC (US);
Inventors:
Joel R. Setchell, Advance, NC (US);
James D. Haley, Winston-Salem, NC (US);
Assignee:
Spot You More, Inc., Raleigh, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A47L 13/20 (2006.01); A61B 5/103 (2006.01); G01C 19/02 (2006.01); G01F 23/00 (2006.01); G01L 19/00 (2006.01); G01N 27/04 (2006.01); A47L 11/40 (2006.01); A47L 13/10 (2006.01); A47L 13/42 (2006.01); G06Q 10/00 (2012.01); A47K 10/18 (2006.01); F21V 31/04 (2006.01); F25D 23/02 (2006.01); G01B 11/00 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
A47L 13/20 (2013.01); A47L 11/4008 (2013.01); A47L 13/10 (2013.01); A47L 13/42 (2013.01); A61B 5/103 (2013.01); G01C 19/02 (2013.01); G01F 23/0007 (2013.01); G01L 19/0092 (2013.01); G01N 27/048 (2013.01); G06Q 10/00 (2013.01); A47K 10/18 (2013.01); F21V 31/04 (2013.01); F25D 23/028 (2013.01); G01B 11/005 (2013.01); G01L 2019/0053 (2013.01); H04L 67/06 (2013.01);
Abstract
A system for monitoring cleanliness in a store. The system may include a server, a database and at least one sensor. The database may be in communication with the server and may store cleanliness parameters. The system includes at least one sensor configured to transmit measured cleanliness characteristics to the server and the server is configured to transmit a message based on a comparison of the measured cleanliness characteristics and the cleanliness parameters stored in the database.