The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Jan. 28, 2019
Applicants:

Stmicroelectronics Application Gmbh, Ascheim-Dornach, DE;

Stmicroelectronics S.r.l., Agrate Brianza, IT;

Inventors:

Domenico Massimo Porto, Catania, IT;

Giovanni Luca Torrisi, Catania, IT;

Manuel Gaertner, Feldkirchen, DE;

Sergio Lecce, Pavia, IT;

Assignees:

STMICROELECTRONICS S.R.L., Agrate Brianza, IT;

STMICROELECTRONICS APPLICATION GMBH, Ascheim-Dornach, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 7/20 (2006.01); H01L 23/34 (2006.01); H03K 17/08 (2006.01);
U.S. Cl.
CPC ...
H05K 7/20945 (2013.01); H01L 23/34 (2013.01); H01L 2924/0002 (2013.01); H03K 2017/0806 (2013.01); Y10T 307/773 (2015.04);
Abstract

A thermal control process for an electronic power device including a multi junction integrated circuit may include defining a first and at least one second groups of junctions, with each group including one first and at least one second junctions, and associating a thermal detector with each group. A first group control may be executed which detects group electric signals representative of the temperature detected by the thermal detectors, processes the group electric signals with reference to a group critical thermal event, identifies a critical group when the corresponding group electric signal detects the critical group thermal event, and generates group deactivating signals suitable for selectively deactivating the first and the at least one second junctions of the identified critical group with respect to the remaining junctions of the integrated circuit.


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