The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Nov. 06, 2018
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Abhishek Mukherji, Milpitas, CA (US);

Huy Phuong Tran, Portland, OR (US);

Rong Peng, Los Altos, CA (US);

Santosh Ghanshyam Pandey, Fremont, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/029 (2018.01); H04W 16/24 (2009.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04W 4/029 (2018.02); H04W 16/24 (2013.01); H04W 84/12 (2013.01);
Abstract

It may be determined that each of a first plurality of devices was stationary at a location based on received first location information. Next, a first estimated ground truth may be determined for each of the first plurality of devices at the location based on the first location information corresponding to each of the respective first plurality of devices at the location. A first plurality of location estimation errors may then be determined for each of the first plurality of devices at the location respectively based on the first location information corresponding to each of the respective first plurality of devices at the location and the first estimated ground truth for each of the respective first plurality of devices at the location. Next, each of the determined first plurality of location estimation errors for each of the first plurality of devices at the location may be aggregated to provide a first location accuracy measurement for the location.


Find Patent Forward Citations

Loading…