The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Dec. 26, 2018
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;

Inventors:

Hiroya Nojiri, Nagoya, JP;

Yoji Sohara, Nagoya, JP;

Assignee:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00949 (2013.01); H04N 1/00474 (2013.01); H04N 1/00915 (2013.01); H04N 2201/0094 (2013.01);
Abstract

A non-transitory computer-readable storage medium stores computer-readable instructions for a processor to perform a first and second processes. The first process comprises: generating first scan data; acquiring a first feature data set indicating features of the first scan data; selecting using the first feature data set as input data, one or more of target workflow parameter sets according to a selection procedure based on selection criteria indicated by selection criteria data; and executing a process on the first scan data according to one of the selected one or more target workflow parameter sets. The second process comprises: acquiring a workflow parameter set; generating second scan data; acquiring a second feature data set indicating features of the second scan data; and updating the selection criteria data to add the workflow parameter set to the target workflow parameter sets and to reflect the second feature data set in the selection criteria data.


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