The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Sep. 22, 2017
Tanium Inc., Emeryville, CA (US);
Christian L. Hunt, Chapel Hill, NC (US);
Thomas R. Gissel, Apex, NC (US);
Aaron Tarter, Chapel Hill, NC (US);
Daniel Floyd, Raleigh, NC (US);
Benjamin Hobbs, Vacaville, CA (US);
Michael Smith, Raleigh, NC (US);
TANIUM INC., Emeryville, CA (US);
Abstract
This application is directed to an integrity monitoring method performed at a computational machine in a linear communication orbit. The computational machine receives a watch list through the linear communication orbit. The watch list identifies objects for which events are to be monitored at the computational machine. While a plurality of events are occurring locally at the computational machine, the computational machine identifies the plurality of events in real-time. The identified events include events for the objects identified by the watch list, and event information for these identified events is stored in a local database of the computational machine. In response to an integrity reporting request received through the linear communication orbit, the computational machine identifies event information for at least some of the objects identified by the watch list in the local database, and returns the identified event information to a server system through the linear communication orbit.