The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Oct. 14, 2016
Amazon Technologies, Inc., Seattle, WA (US);
David Mozealous, Seattle, WA (US);
Arpit Dhandhania, Bangalore, IN;
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
A distributed testing service for providing responsive and fault-tolerant testing computing platforms within a range of configurable testing conditions. The distributed testing service may be provide an independent worker registry service, a repository service, and multiple worker nodes. Further, the worker nodes may push, or initiate, transmissions to provide status information that may be used to determine appropriate worker nodes to client computers that are requesting worker nodes for executing test cases. The distributed testing service may provide network information for worker nodes to client computers so that communications involving executing the test cases on the worker nodes to not include the worker registry service or the repository service.