The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Jun. 04, 2018
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Byungchul Lee, Hwaseong-si, KR;

Heungcheol Jeong, Hwaseong-si, KR;

Myungsoo Huh, Suwon-si, KR;

Jongsung Kim, Cheonan-si, KR;

Byoung-hoon Choi, Hwaseong-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 51/00 (2006.01); G01B 11/27 (2006.01); G01N 21/956 (2006.01); H01L 51/56 (2006.01); B41J 2/21 (2006.01); B41J 25/00 (2006.01); H01L 27/32 (2006.01); B41J 2/01 (2006.01);
U.S. Cl.
CPC ...
H01L 51/0012 (2013.01); B41J 2/2135 (2013.01); B41J 2/2146 (2013.01); B41J 25/001 (2013.01); G01B 11/272 (2013.01); G01N 21/956 (2013.01); H01L 51/56 (2013.01); B41J 2/01 (2013.01); B41J 25/003 (2013.01); G01B 2210/56 (2013.01); H01L 27/3244 (2013.01); H01L 51/0005 (2013.01);
Abstract

A display panel manufacturing system includes a substrate providing module configured to provide a substrate including an active region on which thin-film transistors are disposed, and a peripheral region adjacent to the active region, a test substrate providing module configured to provide a test substrate, an organic film forming module configured to form an ink pattern on each of the substrate and the test substrate, the organic film forming module including a plurality of heads, each of which is configured to drop an ink, an offset inspection module configured to inspect the ink pattern on the substrate, a pattern inspection module configured to inspect the ink pattern on the test substrate, and a droplet inspection module configured to inspect an ink, which is dropped from a head selected from the heads.


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