The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Oct. 05, 2011
Applicants:
Fritz Huber, Regensburg, DE;
Renate Kirchhoefer, Regensburg, DE;
Volker Pfahlert, Kandern, DE;
Inventors:
Assignee:
numares AG, Regensburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G16B 99/00 (2019.01); G01R 33/46 (2006.01); G01N 24/08 (2006.01); G06G 7/58 (2006.01); G16B 40/00 (2019.01);
U.S. Cl.
CPC ...
G16B 99/00 (2019.02); G01N 24/08 (2013.01); G01R 33/4625 (2013.01); G16B 40/00 (2019.02);
Abstract
A method for characterizing a sample is disclosed, having the following steps: providing at least one analysis result having a plurality of values, wherein the analysis result was generated by the analysis of a sample by at least one analysis method; determining the value of at least one mathematic relation between at least two values of the plurality of values; generating a characterizing signature of the sample on the basis of the value of the at least one mathematic relation. Furthermore, a method for characterizing a system is disclosed in which method the preceding method is used.