The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Jan. 05, 2018
Fanuc Corporation, Yamanashi, JP;
Shouta Takizawa, Yamanashi, JP;
Fumikazu Warashina, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A camera abnormality cause estimation system for estimating the causes of abnormalities in a camera in a production system in which the camera controls a robot. The production system includes a robot, a camera that detects visual information of the robot or the surrounding thereof, and a controller that controls the robot based on an image signal obtained by the camera. The camera abnormality cause estimation system estimates the causes of abnormalities in the camera and includes an environment information acquisition unit that acquires environment information of the camera, and an abnormality cause estimation unit that estimates a probability that each of a plurality of predetermined abnormality cause items is the cause of an abnormality in the camera for the respective abnormality cause items using the environment information acquired by the environment information acquisition means and displays the estimated probability on a display unit for the respective abnormality cause items.