The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Sep. 06, 2017
Applicant:
Keyence Corporation, Osaka, JP;
Inventor:
Yohei Okawa, Osaka, JP;
Assignee:
Keyence Corporation, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01B 9/02 (2006.01); G01B 11/24 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G01B 9/0203 (2013.01); G01B 9/0209 (2013.01); G01B 9/02041 (2013.01); G01B 9/02087 (2013.01); G01B 11/24 (2013.01); G01B 11/2441 (2013.01); H04N 5/2256 (2013.01); G01B 2290/35 (2013.01); G06T 2207/10141 (2013.01);
Abstract
To provide a shape measuring device capable of quickly and accurately acquiring a measurement value of a desired part of a measuring object. A specifying sectionsets, on the basis of a relative positional relation between the first region in the measurement luminance image and a second region in the reference luminance image, a measurement target region corresponding to the reference target region in the measurement height image. A calculating sectioncalculates, on the basis of measurement height image data, a measurement value concerning height of the measuring object in the measurement target region.