The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Oct. 06, 2016
Applicant:
Fuchs Consulting, Inc., Leesburg, VA (US);
Inventor:
Paul A. Fuchs, Leesburg, VA (US);
Assignee:
Fuchs Consulting, Inc., Leesburg, VA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/00 (2017.01); H04N 5/247 (2006.01); H04N 5/33 (2006.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01); G01N 25/72 (2006.01); G06K 9/00 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01N 25/72 (2013.01); G06K 9/00771 (2013.01); H04N 5/2252 (2013.01); H04N 5/232 (2013.01); H04N 5/23206 (2013.01); H04N 5/247 (2013.01); H04N 5/33 (2013.01); G01J 2005/0081 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30132 (2013.01); G06T 2207/30184 (2013.01);
Abstract
An infrared measurement system and method including taking multiple time lapse infrared images and visual images of a large-scale object over an extended period of time and analyzing such in order to better measure internal defects are described. Data collected over extended intervals of time are processed to provide measurements which are not affected by ambient conditions and the material properties of the object. The system may include infrared camera(s), visual (video) camera(s), external sensor(s), and an embedded computer.