The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Jan. 27, 2017
Applicant:

Signal Processing, Inc., Rockville, MD (US);

Inventor:

Chiman Kwan, Rockville, MD (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 7/33 (2017.01); G06T 7/35 (2017.01); G06K 9/20 (2006.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0063 (2013.01); G06K 9/2018 (2013.01); G06K 9/6249 (2013.01); G06K 9/6284 (2013.01); G06T 3/4069 (2013.01); G06T 5/003 (2013.01); G06T 5/50 (2013.01); G06T 7/33 (2017.01); G06T 7/35 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10036 (2013.01); G06T 2207/10041 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A method and system for enhancing predictive accuracy of planet surface characteristics from orbit using an extended approach of Pan-Sharpening by using multiple high resolution bands to reconstruct high resolution hyperspectral image is disclosed. Sparsity based classification algorithm is applied to rock type classification. An Extended Yale B face database is used for performance evaluation; and utilizing deep Neural Networks for pixel classification. The present invention presents a system that can significantly enhance the predictive accuracy of surface characteristics from the orbit. The system utilizes complementary images collected from imagers onboard satellites. The present system and method generates high spatial high spectral resolution images; accurate detection of anomalous regions on Mars, Earth, or other planet surfaces; accurate rock/material classification using orbital data and the surface characterization performance will be comparable to in-situ results; and accurate chemical concentration estimation of rocks.


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