The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Mar. 16, 2017
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

David Aaron Gianetto, Palos Verdes Estates, CA (US);

Stephanie Sharo Chiesi, Tucson, AZ (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01); G06F 16/25 (2019.01); G06F 16/28 (2019.01); G06F 16/21 (2019.01); G06F 16/23 (2019.01); G06F 16/2457 (2019.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06F 16/9024 (2019.01); G06F 16/212 (2019.01); G06F 16/2365 (2019.01); G06F 16/24578 (2019.01); G06F 16/252 (2019.01); G06F 16/285 (2019.01); G06Q 10/00 (2013.01);
Abstract

A system and method generates two weighted property graph data models to represent a system architecture. The models each include a plurality of vertices representing a plurality of instances of a design dimension of the system architecture and a plurality of weighted compositional edges that connect first pairs of vertices to represent hierarchical directed-composition and hierarchical directed-decomposition of first pairs of instances of the design dimension represented by the corresponding connected first pairs of vertices with respect to one another, while only the first model includes a plurality of weighted interface edges that connect second pairs of the vertices to represent an information exchange interface between second pairs of instances of the design dimension represented by the corresponding connected second pairs of the vertices. Betweenness hierarchical clusters of each of the two models are generated and correlated with each other to quantify a consistency of the system architecture.


Find Patent Forward Citations

Gianetto, David. (2019). Quantifying consistency of a system architecture by comparing analyses of property graph data models representing different versions of the system architecture (U.S. Patent No. 10496704). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10496704

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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