The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Nov. 02, 2016
Event analysis apparatus, event analysis systems, event analysis methods, and event analysis program
Applicant:
Yokogawa Electric Corporation, Tokyo, JP;
Inventors:
Zhuo Liu, Tokyo, JP;
Yuichi Sakuraba, Tokyo, JP;
Assignee:
Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2458 (2019.01); G06F 7/08 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2465 (2019.01); G06F 7/08 (2013.01); G06F 11/302 (2013.01); G06F 11/3006 (2013.01); G06F 11/3476 (2013.01);
Abstract
An event analyzer includes: an event collector configured to collect event log data representing operation history which an DCS operator performed; a basic unit operation analyzer configured to analyze event log data, and extract basic unit operation data representing operation method based on the operation by the DCS operator; and an unit operation analyzer configured to analyze basic unit operation data, and extract unit operation data representing intention of the operation by the DCS operator.