The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Feb. 08, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Srikanth Kandula, Redmond, WA (US);

Surajit Chaudhuri, Redmond, WA (US);

Bolin Ding, Redmond, WA (US);

Anil Atmanand Shanbhag, Cambridge, MA (US);

Aleksandar Vitorović, Chavannes-près-Renens, CH;

Matthaios Olma, Lausanne, CH;

Robert Grandl, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); G06F 16/2453 (2019.01); G06N 7/00 (2006.01); G06F 16/22 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24542 (2019.01); G06F 16/2246 (2019.01); G06F 16/2453 (2019.01); G06F 16/2462 (2019.01); G06N 7/005 (2013.01);
Abstract

One or more approximations of query output in a data analytics platform are controlled. The one or more approximations are controlled by generating values of error metrics associated with placements of samplers in one or more query execution plans associated with the query, and injecting a plurality of samplers into the query execution plans, using the determined values of the error metrics, in lieu of storing samples of input to the query prior to execution of the query.


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