The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Feb. 17, 2017
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Ripon K. Saha, Santa Clara, CA (US);
Mukul R. Prasad, San Jose, CA (US);
Hiroaki Yoshida, Cupertino, CA (US);
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A method may include obtaining a plurality of synthesized method invocations using a plurality of objects and a plurality of methods of a software program. The method may also include determining a prioritization of the plurality of synthesized method invocations based on one or more of: relationships between one or more characteristics of each of the plurality of synthesized method invocations and a fault location; and relationships between the one or more characteristics and an error report that corresponds to the fault location. The method may also include selecting a synthesized method invocation from the plurality of synthesized method invocations for repair operations with respect to the fault location based on a corresponding prioritization of the selected synthesized method invocation. In addition, the method may include performing repair operations with respect to the fault location and the selected synthesized method invocation.