The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Jan. 21, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Avitan Gefen, Tel Aviv, IL;

Amihai Savir, Sansana, IL;

Ran Taig, Beer Sheva, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06F 11/0769 (2013.01); G06F 16/9024 (2019.01);
Abstract

Embodiments for finding a root cause of an anomaly in a network environment by representing assets in the network environment as respective nodes in a causal graph, wherein the nodes have a measurable quality that can be tracked and arcs between pairs of nodes represent causal relationships between nodes of the node pairs designating source nodes as processes at the top of a hierarchy of tracked processes, and sink nodes as processes at the bottom of the hierarchy and having characteristics of interest in the environment; detecting anomalies in the tracked processes embodied in the sink nodes; traversing the causal graph in a reverse order from a node in which an outlier is detected; and analyzing nodes along the traversal path to identify a node of the highest hierarchy that shows unusual behavior as the root cause.


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