The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Dec. 30, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Wayne E. Garrett, Jr., Bellingham, MA (US);

Joseph J. Burbage, Jr., Townsend, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0604 (2013.01); G06F 3/0638 (2013.01); G06F 3/0653 (2013.01); G06F 3/0673 (2013.01);
Abstract

There are disclosed herein techniques for use in acquiring data storage metrics. The techniques comprise monitoring an I/O operation relating to data storage. The techniques also comprise producing a metric value in connection with the I/O operation. The techniques also comprise determining a current metric value associated with a memory location in an operating system kernel. The techniques also comprise performing a computation to generate a new metric value. The computation is based on the metric value and the current metric value. The techniques further comprise storing the new metric value in the memory location in the operating system kernel.


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