The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Sep. 22, 2016
Ihi Corporation, Koto-ku, JP;
Diesel United, Ltd., Chiyoda-ku, JP;
Takashi Fujii, Aioi, JP;
IHI Corporation, Koto-ku, JP;
DIESEL UNITED, LTD., Chiyoda-ku, JP;
Abstract
A measured value analysis apparatus includes a controller and a memory, in which the controller: selects one examination object item, which is an examination object, and a plurality of related items which are directly or indirectly related to the examination object item; creates a correlation model between measured values from past measured values of the examination object item and the plurality of related items; and calculates a predicted value of the examination object item by applying the measured values of the related items to the correlation model and calculates divergence between an actual measured value of the examination object item and the predicted value.