The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Jul. 30, 2015
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for designing an off-axis three-mirror imaging system with freeform surfaces is provided. A primary mirror initial structure, a secondary mirror initial structure, and a tertiary mirror initial structure are established. A number of first feature rays are selected, while the primary mirror initial structure and the secondary mirror initial structure unchanged. The first feature rays are forward ray tracked from an object space to an image detector. A number of first feature data points are calculated to obtain a tertiary mirror. A number of fields and a number of second feature rays are selected, while the secondary mirror initial structure and the tertiary mirror unchanged. The second feature rays are reverse ray tracked from the image detector to the object space. A number of second feature data points are calculated to obtain the primary mirror.