The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Apr. 18, 2016
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/18 (2006.01); G01N 21/47 (2006.01); G02B 21/00 (2006.01); G02B 21/10 (2006.01); G02B 21/36 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02B 21/18 (2013.01); G01N 21/47 (2013.01); G02B 21/0052 (2013.01); G02B 21/0064 (2013.01); G02B 21/10 (2013.01); G02B 21/362 (2013.01); G02B 21/367 (2013.01); G02B 21/06 (2013.01);
Abstract
A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.