The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Apr. 21, 2017
Applicant:

Johnstech International Corporation, Minneapolis, MN (US);

Inventors:

Jose Lopez, Sunnyvale, CA (US);

Mehdi Attaran, Murrieta, CA (US);

Assignee:

Johnstech International Corporation, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01);
Abstract

A test device for manually testing chips/ICs is disclosed. A housing includes a receiver for a device under test (DUT). The DUT must be pressed into the housing to make adequate contact with the test pins in the bottom of the test device. A screw drive presses the DUT into position and a plurality of holes in the turning knob accommodate through-going pins which on one leg extend through the knob and into an interference path of a fixed barrier stop. The extended leg then engages the stop during rotation to end the downward movement of the screw. Adjustment is made by selecting holes where the pins are inserted. Reversing the pins in the hole allows for storage of the pins when not in use.


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