The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Sep. 18, 2017
Seyed Omid Reza Moheimani, Allen, TX (US);
Farid Tajaddodianfar, Dallas, TX (US);
Ehud Fuchs, Plano, TX (US);
John Randall, Richardson, TX (US);
Joshua Ballard, Richardson, TX (US);
James Owen, Garland, TX (US);
Seyed Omid Reza Moheimani, Allen, TX (US);
Farid Tajaddodianfar, Dallas, TX (US);
Ehud Fuchs, Plano, TX (US);
John Randall, Richardson, TX (US);
Joshua Ballard, Richardson, TX (US);
James Owen, Garland, TX (US);
Zyvex Labs, LLC, Richardson, TX (US);
Texas and Board of Regents, The University of Texas System, Austin, TX (US);
Abstract
Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.