The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Jun. 10, 2016
Applicant:
Atware, Saint Cyr sous Dourdan, FR;
Inventor:
Thierry Augais, Saint Cyr sous Dourdan, FR;
Assignee:
ATWARE, Saint Cyr Sous Dourdan, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/74 (2006.01); G01N 33/543 (2006.01); G01N 33/53 (2006.01); H01F 5/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/745 (2013.01); G01N 33/5302 (2013.01); G01N 33/54326 (2013.01); G01N 33/54346 (2013.01); H01F 5/04 (2013.01);
Abstract
A device for measuring a quantity of a superparamagnetic material includes four coils (-) and a unit for injecting, into the coils, a direct current and two alternating currents of different frequencies. The quantity of superparamagnetic material is derived from an amplitude of a component at a mixing frequency, which frequency is a linear combination of the frequencies of the two alternating currents. The device is designed to reduce the influence of stray electromagnetic fields and inadvertent signal offsets on the measurement results. The device may advantageously be used for immunoassays.