The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Nov. 29, 2016
Applicant:

Asqella Oy, Helsinki, FI;

Inventors:

Arttu Luukanen, Helsinki, FI;

Mikko Leivo, Helsinki, FI;

Anssi Rautiainen, Espoo, FI;

Aleksi Tamminen, Helsinki, FI;

Assignee:

ASQELLA OY, Helsinki, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 22/00 (2006.01); G01V 8/00 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01V 8/005 (2013.01); G01N 2223/101 (2013.01); G01N 2223/3302 (2013.01); G01N 2223/413 (2013.01); G01N 2223/501 (2013.01);
Abstract

An imaging apparatus that includes a scanning mirror arrangement, optics, and a detector arrangement comprising a plurality of detectors. The plurality of detectors are capable for detecting submillimeter-/millimeter-range electromagnetic radiation and arranged within a region defined by an outer periphery and an inner periphery of the detector arrangement. The outer and inner peripheries are substantially circular in shape.


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Luukanen, Arttu. (2019). Imaging apparatus for monitoring objects (U.S. Patent No. 10495585). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10495585

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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