The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Apr. 08, 2014
Konica Minolta, Inc., Tokyo, JP;
Yukito Nakamura, Saitama, JP;
Takatoshi Kaya, Tokyo, JP;
Kosuke Nagae, Tokyo, JP;
Akitoshi Nozaki, Tokyo, JP;
Fumio Nagai, Tokyo, JP;
Ryouta Ishikawa, Tokyo, JP;
Akiyuki Namatame, Tokyo, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.