The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Feb. 06, 2015
Applicant:
Korea Research Institute of Standards and Science, Daejeon, KR;
Inventors:
Ri Mi Lee, Daejeon, KR;
Dong Hyun Jo, Seoul, KR;
Jeong Hun Kim, Seoul, KR;
Tae Geol Lee, Daejeon, KR;
Assignee:
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01);
U.S. Cl.
CPC ...
G01N 15/08 (2013.01); G01N 2015/0853 (2013.01);
Abstract
Provided is a method for screening drugs, more particularly, a method for screening drugs by measuring capacitance of an endothelial cell layer at a frequency region of 100 Hz to 5 kHz to screen a drug affecting paracellular permeability of the endothelial cell layer or a drug penetrating through a paracellular path.