The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

May. 31, 2016
Applicant:

Hamilton Sundstrand Corporation, Windsor Locks, CT (US);

Inventors:

George M. Bollas, Tolland, CT (US);

Kyle Palmer, Willington, CT (US);

Dilip Prasad, North Granby, CT (US);

Clas A. Jacobson, Tolland, CT (US);

John M. Maljanian, Jr., Farmington, CT (US);

Richard A. Poisson, Avon, CT (US);

Young K. Park, Simsbury, CT (US);

Assignee:

HAMILTON SUNDSTRAND CORPORATION, Windsor Locks, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G05B 23/02 (2006.01); G06F 17/50 (2006.01); B64D 13/08 (2006.01); G01N 17/00 (2006.01); B64D 13/06 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01); B64D 13/08 (2013.01); G05B 23/0254 (2013.01); G06F 11/008 (2013.01); G06F 17/5009 (2013.01); B64D 2013/0603 (2013.01); F28F 2200/00 (2013.01); G01N 17/008 (2013.01);
Abstract

A computer-implemented method for designing a built-in test is described. The method includes receiving, via a processor, a subsystem model including system parameters for a heat exchanger, wherein each of the system parameters includes a sensor variance; determining, via the processor, a test design vector based on one or more of the system parameters; and designing, via the processor, the built-in test based on the test design vector.


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