The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Sep. 15, 2017
Sentek Instrument, Llc, Blacksburg, VA (US);
SENTEK INSTRUMENT LLC, Blacksburg, VA (US);
Abstract
A sensor apparatus and system for measuring pressure, temperature or both with a single interrogator includes a sensor having a cavity, a diaphragm and an optical element or base for conducting energy to and from the cavity and diaphragm. The two surfaces of the diaphragm and a surface of optical element and either surface of the diaphragm are partially reflecting surfaces and respectively define two optical path distances (OPDs) that produce preferential reflections and interference patterns at different optical frequencies or wavelengths that are respectively affected by pressure or temperature. Arranging the OPDs such that the fundamental frequency and harmonics of preferential reflections one OPD do not coincide with the fundamental frequency or harmonics of another OPD provides for both temperature and pressure measurement with a single interrogator and without complex spectral analysis.