The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Jan. 17, 2018
Applicant:
Lightmachinery Inc., Nepean, Ontario, CA;
Inventors:
Hubert Jean-Ruel, Ottawa, CA;
John Reid, Stittsville, CA;
John H. Hunter, Almonte, CA;
Jesse Dean, Ottawa, CA;
Edward S. Williams, Kanata, CA;
Ian J. Miller, Ottawa, CA;
Assignee:
LightMachinery Inc., Ottawa, Ontario, CA;
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/26 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01N 21/25 (2006.01); G01J 3/04 (2006.01); G02B 26/08 (2006.01); G01J 3/18 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0294 (2013.01); G01J 3/0208 (2013.01); G01J 3/0256 (2013.01); G01J 3/04 (2013.01); G01J 3/18 (2013.01); G01J 3/26 (2013.01); G01J 3/2803 (2013.01); G01N 21/255 (2013.01); G02B 26/0808 (2013.01); G02B 27/1066 (2013.01);
Abstract
The invention relates to a multi-resolution optical spectrometer that employs two output lenses of different focal length to provide a broad wavelength range, coarse resolution spectral measurement and a high resolution, lower range spectral measurement. Light dispersed by a virtual image phase array followed by a diffraction grating in two different dispersion orders may be separately focused by the two lenses upon to 2D detector array to provide the two measurements.