The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Dec. 16, 2013
Endress + Hauser Conducta Gesellschaft Für Mess- Und Regeltechnik Mbh + Co. KG, Gerlingen, DE;
Benjamin Bertsch, Gerlingen, DE;
Matthias Grossmann, Vaihingen-Enz, DE;
Thilo Kratschmer, Stuttgart, DE;
Endress+Hauser Conducta GmbH+Co. KG, Gerlingen, DE;
Abstract
An arrangement for measuring process variables of a medium. The arrangement includes a housing embodied for accommodating a measuring apparatus for determining the physical and/or chemical process variable(s), wherein arranged in the housing is at least one window and at least the window contacts the medium, and wherein an oscillatory transducer is provided for transmitting sound waves, characterized in that the window is connected rigidly with the housing, the oscillatory transducer is arranged in a peripheral module having a module housing. The peripheral module is so arranged that the oscillatory transducer transmits the sound waves toward the window, wherein the sound waves pass through the module housing at an exit area, and the peripheral module is so arranged that medium is located in the region of the window and exit area.