The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Feb. 26, 2018
Continental Reifen Deutschland Gmbh, Hannover, DE;
Adrian Cyllik, Hannover, DE;
Carsten Hahn, Laatzen, DE;
Michael Lehn, Celle, DE;
Heiner Volk, Neustadt, DE;
Joachim Welser, Neustadt, DE;
Cord-Christian Neuber, Wunstorf, DE;
Jenny Huynh, Hamburg, DE;
Continental Reifen Deutschland GmbH, Hannover, DE;
Abstract
A method is for determining a profile depth of a tire profile. The method includes at least the following steps: a) detecting an acceleration of a measurement point on a tire inner side of a vehicle tire, wherein a deviation, caused by contact of the vehicle tire with a roadway, of the acceleration of the measurement point within an observation window is detected, b) deriving at least one analytical characteristic variable which is characteristic of the profile of the detected acceleration, wherein the at least one analytical characteristic variable characterizes the non-periodic profile of the detected acceleration within one tire rotation, c) determining the profile depth in a manner dependent on the at least one analytical characteristic variable, wherein a calibration curve yields the dependency between the analytical characteristic variable and the profile depth, and the calibration curve assigns a profile depth to the derived analytical characteristic variable.