The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Jun. 07, 2018
Applicant:
General Electric Company, Schenectady, NY (US);
Inventor:
Daniel Scott Groninger, Port Royal, PA (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/00 (2006.01); G01N 29/22 (2006.01); G01N 27/90 (2006.01); G01N 29/06 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01B 21/00 (2013.01); G01N 27/90 (2013.01); G01N 27/9006 (2013.01); G01N 29/0609 (2013.01); G01N 29/0645 (2013.01); G01N 29/22 (2013.01); G01N 29/265 (2013.01);
Abstract
An inspection system, in an embodiment, can be operable with a probe and a position tracker to inspect an object. The system can be operable to display at least one probe travel axis, receive first and second inspection values from the probe, associate the first inspection value with a first position point, and associate the second inspection value with a second position point. The system displays an inspection path based on the associations. The inspection path extends relative to the probe travel axis.