The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Oct. 26, 2017
Industrial Technology Research Institute, Hsinchu, TW;
Min-Qiao Lu, Hsinchu, TW;
Chin-Chia Chang, Hsinchu, TW;
Yi-Chia Hsu, Hsinchu, TW;
Kuo-Chih Wang, Hsinchu, TW;
Yao-Hui Lee, Hsinchu, TW;
Yi-Cheng Chen, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A measuring equipment is provided. The equipment includes: a multi-axial actuated device; at least one sensor disposed on the multi-axial actuated device to adjust the orientation of the at least one sensor by the multi-axial actuated device, wherein scanning constraints of the sensor include a movable range of the at least one sensor, a scanning range of the at least one sensor and a scanning dead space of the at least one sensor for the contour of an object to be tested; a rotating device configured to rotate the object; and a processing device configured to obtain information relating to an optimal scanning orientation of the sensor based on the scanning constraints, and configured to control the multi-axial actuated device to adjust the at least one sensor.