The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Jun. 26, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Sentaro Aihara, Utsunomiya, JP;

Yeshwanth Srinivasan, Austin, TX (US);

Steven Wayne Burns, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 43/56 (2006.01); G03F 7/00 (2006.01); B05C 9/02 (2006.01); H01L 21/027 (2006.01); G03F 9/00 (2006.01);
U.S. Cl.
CPC ...
B29C 43/56 (2013.01); B05C 9/02 (2013.01); G03F 7/0002 (2013.01); G03F 9/7038 (2013.01); G03F 9/7088 (2013.01); H01L 21/027 (2013.01);
Abstract

The present invention provides an imprint apparatus which forms a pattern of an imprint material onto a substrate by using a mold, the apparatus including a control unit configured to provide a user interface for displaying a first map indicating a supply position of the imprint material to be supplied onto the substrate, an adjustment window for adjusting a value of an apparatus parameter which is set in the imprint apparatus and used to change a supply position of the imprint material, and a second map indicating a supply position of the imprint material after adjustment of the value of the apparatus parameter.


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