The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Jul. 08, 2015
Applicant:

The General Hospital Corporation, Boston, MA (US);

Inventors:

Rajiv Gupta, Wayland, MA (US);

Yongjin Sung, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/30 (2006.01); G01N 23/04 (2018.01); G01V 5/00 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4014 (2013.01); A61B 6/032 (2013.01); A61B 6/0407 (2013.01); A61B 6/4007 (2013.01); A61B 6/4241 (2013.01); A61B 6/4291 (2013.01); A61B 6/4429 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/5282 (2013.01); A61B 6/5264 (2013.01);
Abstract

A system and method for computed tomography (CT) imaging is provided. The system includes a gantry having a first and second circumference defining locations fixed in relation to a subject arranged therein, the first and second circumference being axially separated, and spaced from a central axial plane of the gantry. The system also includes a plurality of source modules arranged at locations along the first circumference, and configured for directing X-ray beams toward the subject using a selected illumination pattern, and a plurality of detector modules arranged at locations along the second circumference, wherein the source and detector modules are angled toward the central axial plane such that each source module is diametrically opposed to one or more detector modules. The system further includes an acquisition system configured for controlling the plurality of source modules in accordance with the selected illumination pattern, and acquiring CT image data from the plurality of detector modules.


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