The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Dec. 02, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
Koji Nozato, Rochester, NY (US);
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical imaging system, method, and medium for imaging a subject. Measure an aberration state of light from the subject is measured. Determine a condition of the subject based on the aberration state of the light, and if the subject is in a first condition or a second condition. An aberration correction device that adjusts a state of the light. In a first case if the subject is in the first condition than the light is adjusted based on the aberration state of the light used to determine that the subject is in the first condition. In a second case if the subject is in the second condition than the light is adjusted based on based on a most recent aberration state of the light that was used to determine that the subject was in the first condition prior to detecting that the subject is in the second condition.