The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Apr. 07, 2015
Applicant:

Essilor International (Compagnie Generale D'optique), Charenton-le-Pont, FR;

Inventors:

Stephane Boutinon, Charenton-le-Pont, FR;

Vincent Tejedor Del Rio, Charenton-le-Pont, FR;

Michel Nauche, Charenton-le-Pont, FR;

Assignee:

Essilor International, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/028 (2006.01); A61B 3/036 (2006.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0285 (2013.01); A61B 3/0075 (2013.01); A61B 3/028 (2013.01); A61B 3/036 (2013.01); G02B 3/0081 (2013.01);
Abstract

A refractor () includes: an enclosure having a front face containing a first optical window and a back face containing a second optical window aligned with the first optical window along an optical axis of observation; and at least one vision compensating device making it possible to observe along the optical axis of observation. The vision compensating device includes, between the first window and the second window, a first optical element having a spherical power along the optical axis, the spherical power being variable. The enclosure is mounted on an orientable holder () that is rotatable relative to a stationary portion () about a horizontal axis (H). A method for measuring refraction employing such a refractor is also disclosed.


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