The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Sep. 15, 2017
Olympus Corporation, Tokyo, JP;
Junichi Nishimura, Tokyo, JP;
Atsuyoshi Shimamoto, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A scanning observation apparatus () deflects illumination light with an actuator () through an illumination optical system () to scan an object (), subjects light from the object () to photoelectric conversion with an optical detector (), performs processing with an image processor (), and displays an image of the object () on a display (). A memory () stores information on optical characteristics related to chromatic aberration of magnification of the illumination optical system () relative to light of predetermined colors. A scanning pattern calculator () calculates a scanning pattern, on the object (), of light of each color using the information. Using the scanning pattern, the image processor () calibrates a plot position yielded by a photoelectric conversion signal from the optical detector () for light of each color and generates an image of the object (), thereby more easily correcting the chromatic aberration of magnification.