The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Sep. 04, 2015
Karlsruher Institut Für Technologie, Karlsruhe, DE;
Fraunhofer Gesellschaft Zur Förderung Der Angew. Forschung E.v., München, DE;
Matthias Hartrumpf, Karlsruhe, DE;
Thomas Längle, Eggenstein, DE;
Michael Heizmann, Eggenstein, DE;
Henning Schulte, Karlsruhe, DE;
Eduardo Monari, Karlsruhe, DE;
Markus Vogelbacher, Baden-Baden, DE;
Robin Gruna, Baden-Baden, DE;
Karlsruher Institut fur Technologie, Karlsruhe, DE;
Fraunhofer Gesellschaft Zur Forderung Der Angew. Forschung E.V., Munich, DE;
Abstract
The invention relates to an apparatus for controlling the quality of transparent objects, comprising at least one light source being adapted to illuminate the object, and at least one image capturing device, by means of which at least one image of the object can be detected, wherein the apparatus comprises further at least one reflector, wherein the reflector and the image capturing device define a beam path, wherein the reflector, the image capturing device, and the light source are arranged such that the object can be arranged between the reflector, on the one hand, and the image capturing device and the light source, on the other hand, such that a single sheet of material is located in the beam path. Furthermore, the invention relates to a corresponding method for controlling the quality of transparent objects.