The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Jun. 30, 2016
Applicant:

Symantec Corporation, Mountain View, CA (US);

Inventors:

Dinesh Bhirud, Long Beach, CA (US);

Nobuto Hotta, Torrance, CA (US);

Douglas Schlatter, Playa Vista, CA (US);

Petrus Johannes Viljoen, Manhattan Beach, CA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/145 (2013.01); H04L 63/0245 (2013.01); H04L 63/1425 (2013.01);
Abstract

The present disclosure provides methods for an endpoint ranking system that can take endpoint importance, symptom importance, and symptom timing into account when determining endpoint hygiene scores for endpoints in a network. A list of endpoints that is ranked or sorted according to hygiene score can by dynamically generated and can change over time due to the manner in which symptom timing is taken into account. The list can also evolve as parameters for endpoint importance and system importance are modified. An endpoint-importance weight can be assigned to each endpoint to bias hygiene scores according to endpoint importance. Symptom-importance weights and decay rates can also be assigned to symptom types to further bias hygiene scores.


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