The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Nov. 23, 2015
Applicant:

W2bi, Inc., South Plainfield, NJ (US);

Inventors:

Derek Diperna, Medford Lakes, NJ (US);

Ira Leventhal, San Jose, CA (US);

Keith Schaub, Austin, TX (US);

Artun Kutchuk, San Jose, CA (US);

Assignee:

W2BI, Inc., South Plainfield, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/16 (2015.01); G05B 19/418 (2006.01); H04W 4/80 (2018.01); G06F 3/0346 (2013.01); H04M 1/04 (2006.01); H04N 7/18 (2006.01); H04W 24/02 (2009.01); G06F 11/22 (2006.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01); H04B 17/29 (2015.01); B25J 9/16 (2006.01); H02J 7/02 (2016.01); H04M 1/24 (2006.01); H04W 84/12 (2009.01); H04W 24/06 (2009.01);
U.S. Cl.
CPC ...
H04B 17/16 (2015.01); B25J 9/1679 (2013.01); G05B 19/41875 (2013.01); G06F 3/0346 (2013.01); G06F 11/2221 (2013.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01); H04B 17/29 (2015.01); H04M 1/04 (2013.01); H04N 7/18 (2013.01); H04W 4/80 (2018.02); H04W 24/02 (2013.01); G05B 2219/37021 (2013.01); G05B 2219/37022 (2013.01); G05B 2219/37231 (2013.01); G05B 2219/37368 (2013.01); G05B 2219/37388 (2013.01); G05B 2219/37431 (2013.01); G05B 2219/37433 (2013.01); G05B 2219/37634 (2013.01); G05B 2219/40041 (2013.01); G05B 2219/45089 (2013.01); H02J 7/025 (2013.01); H04M 1/24 (2013.01); H04W 24/06 (2013.01); H04W 84/12 (2013.01);
Abstract

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to and operable to stress a smart device in an enclosure, wherein the enclosure comprises a plurality of components, and wherein the system controller comprises: (a) a memory comprising test logic; and (b) a processor configured to automatically control the plurality of components and test the smart device in accordance with the test logic. Further, the plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto, wherein the stylus is operable to manipulate the smart device; and (b) a platform comprising a device holder affixed thereto, wherein the device holder is operable to receive the smart device, and wherein the platform and the robotic arm are robotically controlled to move by the processor.


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